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- John C. Steiner
- Roger Clark Associates, LLC
- Neil E. Clark
- Roger Clark Associates, LLC
- David R. Thom
- Head Protection Research Laboratory
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- History of Incandescent Light Analysis
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- Extensive Research into Bulb Filament Analysis has
- been published:
- “Advances in the Analysis of Aircraft Crash Impacted Light Bulbs”; T.W.
Heaslip, M. Vermij, M.R. Poole; International Society of Air Safety
Investigators (ISASI)
- Baker, J. Stannard; Aycock, T.; Lindquist, T.; “Lamp Examination for On
or Off in Traffic Accidents”; Topic 823 of the Traffic Accident
Investigations Manual; Traffic Institute, Northwestern University; 1985
- “Accident Reconstruction – Response of Halogen Light Filaments during
Vehicle Collisions”; T.R. Fries, R.O. Lapp; SAE #890856; 1989
- Just to list a few…
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- LED or Light Emitting
- Diode composed of:
- Anode Post
- Bond Wire
- Semiconductor (LED) Chip
- Cathode
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- LEDs operate on voltages of 1 to 4 Volts
- LEDs draw 10 to 40 milliamperes
- LED body is plastic and solid throughout and acts as a lens
- Internal components are very well supported
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- Advantages over incandescent bulbs
- Draw very low current
- Reach full intensity almost instantaneously
- Extremely long service lives
- Shock Resistant
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- Honda ST1300 ABS Touring Bike
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- “Accelerations and Shock Load Characteristics of Tail Lamps From
Full-Scale Automotive Rear Impact Collisions”, L. Johnson, 2002
- Four 1989 Ford Taurus automobiles were used as target vehicles in two
full engagement rear-end tests and two 50% offset rear-end tests
- The Target vehicle used was a Class 8 1960 Kenworth 6x4 truck for two
tests and a 4,000 lbf flat-faced moving barrier were used for the other
two tests
- Accelerometers were mounted in the taillamp assemblies to measure
accelerations during the crash
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- Johnson recorded acceleration levels in the taillights
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- Ten (10) identical LED CHMSL’s were used in this study
- Each lamp was composed of 44 individual LED bulbs mounted on a common
circuit board
- The bulbs were wired in series in discrete sets of four, for a total of
eleven groups of four LEDs
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- Impacts were completed on the test subjects using an instrumented
twin-guide wire drop test device at the Head Protection Research
Laboratory
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- Spherical Impactor was modified to support a lamp test fixture which a
pair of LED CHMSL lamps were mounted
- Two standard trailer tail lamp housings containing one 1157 bulb each
were also mounted with the CHMSL LED lamps
- The fixture was constructed to allow the spherical impactor to contact a
hard rubber anvil mounted on the impact tester, without direct contact
to the lamps
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- The Anvil, or Modular Elastomer Programmer (MEP) is a cylindrical-shaped
pad with a durometer value of 60 ± 2 Shore A
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- Uniaxial Endevco accelerometer
- National Instruments Data Acquisition Card
- Data Acquisition software by Biokinetics version 3.0
- Sampling rate of 10 kHz for 50 msec, and was filtered per SAE J211
- Class 600 (SAE) Filter
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- Power supplied by a Deep Cycle 12-Volt Battery
- Battery voltage maintained at 12.6V ±0.1V throughout the testing by using Battery Charger
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- 5 tests completed at increasingly greater drop heights
- Each test completed one pair of LED CHMSL lamps and one pair of 1157
lamps – one ON and the other OFF
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- Test #1
- Volts=12.6
- Drop Height = 1 m
- V=4.4 m/s
- g=231
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- Test #2
- Volts=12.6
- Drop Height = 2 m
- V=6.2 m/s
- g=396
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- Test #3
- Volts=12.6
- Drop Height = 3 m
- V=7.1 m/s
- g=502
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- Test #4
- Volts=12.6
- Drop Height = 4 m
- V=8.63 m/s
- g=684
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- Test #5 Involved Direct Contact of two LED CHMSL Lamp assemblies
- One powered ON and the other OFF
- Impact of lamps with two extruded steel box sections mounted on 2”x4”
pieces of wood
- Duration exceeded allowable 50 msec window, impact acceleration data is
unknown
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- In all non-contact tests, LED lamps were not effected by the subjected
impacts
- Lamps subjected to direct contact impact still operated unless
completely crushed
- Crushed LED lamps were analyzed
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- Stereo Microscope Analysis of severely damaged LED bulbs revealed no
noticeable indicators
- Guide wire missing or too small to observe
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- LED Samples cut into 1” lengths for analysis using a Scanning Electron
Microscope (SEM)
- SEM used was a Cambridge 360 at approximately 5.1kV
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- Internal LED components could not be viewed with SEM due to the LED bulb
being plastic and non-conductive
- If the bulb was fractured exposing the internal components then the die
wire, LED die, anode and cathode post may be viewed
- In the cases where internal components could be viewed, we were unable
to compare to an undamaged LED
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- Due to the fully potted construction of LEDs, the internal components
are well supported and protected from shock
- Due to the physical size of the LED internal components, analysis is
difficult
- Even when LEDs are fractured so as to expose the internal components,
witness marks to indicate the status of the LED at impact could not be
found
- If further research is unable to outline an analysis method of LED-type
lighting, monitoring of this data could be completed with Event Data
Recorders
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- Controlled destructive tests should be performed on powered LEDs
- The anode posts could be extracted from bulbs in both states of
operation, and the conditions of any remnants of the bond wires at the
tips of the post could be examined for differences in fracture
characteristics
- It is possible that the delicate bond wire that connects the anode post
to the cathode die might exhibit detectable differences in ductile
fracturing, depending on whether the wire fails when it is conducting
current or not
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- For further questions, please contact the authors at:
- John C. Steiner – jsteiner@kevaeng.com
- Neil E. Clark – neclark@rc-recon.com
- David R. Thom – dthom@ci-dynamics.com
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